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Browsing by Author "B.N. Dutta"

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    PublicationBook Chapter
    Lattice constants and thermal expansion of AgCl up to 878 °C by x-ray method
    (De Gruyter, 2021) B.N. Dutta; B. Dayal
    The thermal expansion of AgCl has been studied over the temperature range 25 to 878 °C by the X-ray powder technique. The experimental coefficients can be represented by the interpolation formula αt = 30 × 10-6 + 1.5 × 10-8 t - 0.9 × 10-10 t2 + 0.6499 × 10-12 t3. The presence of Frenkel defects has been discussed. © 1964, The authors.
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    Lattice Constants and Thermal Expansion of Gold up to 878 °C by X‐Ray Method
    (1963) B.N. Dutta; B. Dayal
    The thermal expansion of gold has been studied over the temperature range 25° to 878 °C by the X‐ray powder technique. The experimental coefficients can be represented by the interpolation formula αt = 13.99 × 10−8 + 0.491 × 10−3 t. The work of LAWSON, and MITRA and MITRA is discussed, and it is shown that in this temperature range it is not necessary to postulate the existence of any anomalous expansion arising from lattic defects. Copyright © 1963 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
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    Lattice Constants and Thermal Expansion of Palladium and Tungsten up to 878 °C by X‐Ray Method
    (1963) B.N. Dutta; B. Dayal
    The lattice parameters, and coefficients of thermal expansion, of palladium and tungsten are measured by means of a high temperature X‐ray powder camera. The lattice constants of palladium are expressed by an analytical formula at = 3.8890 × 10− + 4.5 × 10−13 t + 1.37 × 10−16 t2 and those of tungsten by at = 3.1646 × 10−8 + 1.4398 × 10−13 t + 0.3164 × 10−16 t2. It is found that the thermal expansion coefficients can not be satisfactorily explained by Grüneisen's theory. Copyright © 1963 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
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    Lattice constants and thermal expansion of silicon up to 900°C by X-ray method
    (De Gruyter, 2021) B.N. Dutta
    A detailed study of the thermal expansion of silicon is made using an X-ray powder technique, between room temperature and 900 °C. The values only agree with those of MAISSEL below 700 °C, the present values being higher above this temperature. It is found that Gruneisen's two-constant formula cannot fit the present results. © 1962, The authors.
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    PublicationArticle
    The Presence of Anti‐Schottky Defects in Silicon
    (1963) B.N. Dutta; B. Dayal
    [No abstract available]
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