Browsing by Author "J.P. Gauthier"

Now showing 1 - 2 of 2

Influence of incident beam divergence on the intensity of diffuse streaks
(Springer India, 1985) Dhananjai Pandey; S. Lele; Lalita Prasad; J.P. Gauthier
The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relp HK·L of a faulted hexagonal crystal, mounted about its c-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented. © 1985 Indian Academy of Sciences.
Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting
(Wiley-Blackwell, 1987) D. Pandey; L. Prasad; S. Lele; J.P. Gauthier
Because of the inherent beam divergence, point intensities measured using a four-circle diffractometer at equispaced points along the diffuse streak correspond to variable lengths of the streak. Correction factors required to convert the measured intensities into those corresponding to a fixed length at each equispaced point along the diffuse streak are derived for two different crystal mountings under bisecting geometry. A procedure for experimentally verifying the mathematical approach employed in these calculations is also described. © 1987, Wiley-Blackwell. All rights reserved.