Browsing by Author "Punam S. Yadav"

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Enhanced resistance in wheat against stem rust achieved by marker assisted backcrossing involving three independent Sr genes
(Elsevier, 2015) Punam S. Yadav; V.K. Mishra; B. Arun; R. Chand; M.K. Vishwakarma; N.K. Vasistha; A.N. Mishra; I.K. Kalappanavar; Arun K. Joshi
Marker assisted backcrossing (MABC) was used to transfer the three stem rust (Puccinia graminis tritici) resistant genes Sr25, SrWeb and Sr50 into the popular Indian wheat cv. HUW234. The donor was the CIMMYT breeding line PMBWIR4, and each of the target genes was marked by a simple PCR assay. A three step screening strategy was adopted: the first screen comprised foreground selection, the second used markers lying close to the introgression borders to reduce the extent of linkage drag, and the last was background selection based on 149 informative microsatellite assays. Based on the background selection outcomes, at the BC1F1 generation the proportion of the genome fixed for cv. HUW234 alleles ranged from 55% to 67%. Three BC1F1 individuals were crossed a second time with cv. HUW234, resulting in the identification of six BC2F3 families carrying all three target Sr genes; the proportion of their genome inherited from cv. HUW234 ranged from 86% to 92%. BC2F4 and BC2F5 material was planted at three different locations under both disease-free and artificially induced epiphytotic conditions. Compared to recurrent parent, the improved versions of cv. HUW234 displayed significantly superior resistance to stem rust, and their agronomic performance was as good as, or even marginally better than that of the source cultivar. © 2015.
Enhancing spot blotch resistance in wheat by marker-aided backcross breeding
(Springer Netherlands, 2016) Neeraj K. Vasistha; Arun Balasubramaniam; Vinod K. Mishra; Ramesh Chand; Jayasudha Srinivasa; Punam S. Yadav; Arun K. Joshi
The cultivar HUW234 is well adapted and widely grown throughout the Eastern Gangetic plains (EGP) of India. However, popular cultivars of EGP are highly susceptible to the spot blotch disease caused by Bipolaris sorokiniana. The production is highly affected, thereby exerting pressure on the livelihood of the poor and marginal farmers of this region. Two parallel backcross programs were conducted to transfer resistance against spot blotch in the susceptible cultivar HUW 234. The two donor parents were Chirya 3 and Ning 8201. One program targeted the locus QSb.bhu-2A, while the second focused on the two loci Qsb.bhu-2A and Qsb.bhu-5B. Foreground selection was achieved using SSR markers linked to the target(s), and background selection was based on a set of well distributed SSRs. Ten resistant BC3F3 selections were made in Chirya 3 × HUW 234 and 15 in the Ning 8201 × HUW 234. Based on background selection marker genotype, the genetic similarity of the selected BC3F3individuals with the recipient parent reached as high as 94.3 %. The BC3F3selections and those made in BC3F4 and BC3F5showed improved spot blotch resistance in the field, and also yielded better than the recipient parent in presence of the disease. © 2015, Springer Science+Business Media Dordrecht.
Evaluation of bread wheat (Triticum aestivum l.) for terminal heat tolerance
(Indian Society of Genetics and Plant Breeding, 2020) Stuti Krishna; Priyanka Upadhayay; Vinod Kumar Mishra; Shubhra N. Kujur; Monu Kumar; Punam S. Yadav; Parvin Kumar Mahto; Prashant Singh; Ashutosh; Sandeep Sharma; Ramesh Chand
Terminal heat tolerance of 34 wheat genotypes were analyzed for two years. Among 14 traits, canopy temperature, plot yield and days to heading were major components in clustering of genotypes. Three genotypes namely, DBW39, DBW16 and DBW14 had lowest heat susceptibility index (0.34-0.36) for plot yield and were considered as heat tolerant genotypes by both Hierarchical Cluster Analysis as well as Discriminant Analysis. These genotypes may serve as potential donors in wheat breeding to improve the terminal heat tolerance. © 2020, Indian Society of Genetics and Plant Breeding. All rights reserved.
Studies on genetic variability, correlation and path analysis for yield and yield contributing traits in wheat (T. Aestivum L. Em Thell.)
(2012) D.K. Baranwal; V.K. Mishra; M.K. Vishwakarma; Punam S. Yadav; B. Arun
A study was undertaken to analyze the genetic variability, correlation and path coefficient analysis of yield and yield contributing traits in twenty four wheat genotypes grown at BHU Agricultural Farm, during Rabi season of 2010-11. Wide genetic variation was observed among genotypes for days to heading, plant height, tillers per m2 and grains per spike. Considering genetic parameters, high genotypic co-efficient of variation (GCV) was observed for grains per spike, peduncle length, plant height whereas, low GCV was observed for days to heading, chlorophyll content and tillers per m2. In all cases, phenotypic variances were higher than the genotypic variances. High heritability with low genetic advance in per cent of mean was observed for days to heading which indicated the involvement of non-additive gene action for the e×pression of this character and selection for such trait might not be rewarding. High heritability with high genetic advance in per cent of mean was observed for peduncle length and grains per spike indicating that these traits were under additive gene control and selection for genetic improvement for these traits would be effective. Yield per plot had high positive and significant correlation with tillers per m2 and 1000-grain weight. Path coefficient analysis revealed ma×imum direct contribution towards yield per plot with sheath length followed by grains per spike.