Browsing by Author "Shivanand B. Teli"

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A Review on Modern Characterization Techniques for Analysis of Nanomaterials and Biomaterials
(Engineered Science Publisher, 2024) Rai Dhirendra Prasad; Rai Surendra Prasad; Rai Bishvendra Prasad; Saurabh R. Prasad; Shashi Bhushan Singha; Anand Dev Singha; Rai Jitendra Prasad; Shivanand B. Teli; Pramode Sinha; Anil Kumar Vaidya; Sanjay Saxena; Umapati Rai Saxena; Avinash Harale; M.B. Deshmukh; M.N. Padvi; G.J. Navathe
This review is providing a comprehensive overview of essential genuine characterization techniques for nanomaterial and biomaterials exist in various forms. Nanoscience and nanotechnology are one of the trans scientific frontiers, multidisciplinary and environmentally sustainable research field. Today nanomaterials are widely employing in almost every branches of science and technology. As nanomaterials are invisible and unknown in size, shape, so it is enormously needy the advanced characterizations tools to visualize and analyze the materials at nanoscale. The characterization techniques are of paramount importance in the field of nanoscience and technology. This review is to summarize the present knowledge on the use, advances, advantages and weaknesses of a large number of experimental techniques that are available for the characterization of nanoparticles. Different characterization techniques are classified according to the concept or group of technique used, the information they can provide, or the materials that they are destined for. This review is more very much useful to beginner researcher and who are not aware with the advanced characterization techniques and data interpretation. © Engineered Science Publisher LLC 2024.
A Review on Spectroscopic Techniques for Analysis of Nanomaterials and Biomaterials
(Engineered Science Publisher, 2025) Rai Dhirendra Prasad; Prashant D. Sarvalkar; Nirmala Prasad; Saurabh R. Prasad; Shivanand B. Teli; Rai Surendra Prasad; Rai Bishvendra Prasad; Rai Rajnarayan Prasad; C. B. Desai; Anil Kumar Vaidya; Mamata Saxena; V. B. Kale; R. S. Pande; Naresh Prasad Charmode; R. N. Deshmukh; V. N. Patil; Anant Samant; Chandrashekhar Chiplunkar; Zhanhu Hu Guo; Avinash Avadhutrao Ramteke; Jay Ghosh
Spectroscopy, the study of the interaction between electromagnetic radiation and matter, is a versatile and powerful analytical technique used in various scientific disciplines. This review provides a comprehensive overview of spectroscopy, covering its principles, instrumentation, techniques, applications, and recent advancements. Spectroscopy encompasses a wide range of methods, each offering unique insights into the structure, composition, dynamics, and properties of materials. At its core, spectroscopy relies on the measurement of the intensity and wavelength (or frequency) of electromagnetic radiation absorbed, emitted, or scattered by a sample. The interaction between light and matter can reveal valuable information about the chemical, physical, and electronic properties of substances, including molecular structure, electronic transitions, vibrational modes, and magnetic interactions. Thus, spectroscopy remains a cornerstone of scientific research and technological innovation, offering unparalleled capabilities for understanding the properties and behavior of matter across the electromagnetic spectrum. Continued advancements in spectroscopic instrumentation, techniques, and applications promise to further enhance our ability to explore and exploit the mysteries of the universe at the molecular and atomic levels. © 2025, Engineered Science Publisher. All rights reserved.
A Review on Thin Film Technology and Nanomaterial Characterization Techniques
(Engineered Science Publisher, 2024) Rai Dhirendra Prasad; Shivanand B. Teli; Rai Surendra Prasad; Rai Bishvendra Prasad; Saurabh R. Prasad; Pramode Sinha; Amit Sinha; Preety Sinha; Mamata Saxena; Rai Rajnarayan Prasad; R.S. Pande; Naresh Charmode; K.G. Deshmukh; Prashant D. Sarvalkar; U.D. Kadam; Chandrasekhar Chiplunkar; Nirmala Prasad; M.V. Padvi; Zhanhu Guo
Over the last 200 years, there has been an increase in the process of depositing thin film materials, which has been considerably developing. A good understanding of the various deposition methods and processes is necessary to improve the desired film thickness and characteristics. The purpose of this review paper is to display the critical analysis of existing thin film deposition methods. The paper discusses some important thin film techniques that are advanced and suitable for the analysis of thin films. Nanomaterials are invisible and require various advanced characterization to investigate their physical and chemical properties. Therefore, it becomes essential to determine these properties: there is a need for advanced scientific tools for the analysis of nanomaterials and thin films. A comprehensive list of fundamentals of thin film technology, including deposition, structure, film properties, advanced characterization tools and applications are presented together. © Engineered Science Publisher LLC 2024.