Browsing by Author "Xinyao He"

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Development and characterization of the 4th CSISA-spot blotch nursery of bread wheat
(Kluwer Academic Publishers, 2015) Pawan K. Singh; Yong Zhang; Xinyao He; Ravi P. Singh; Ramesh Chand; Vinod K. Mishra; Paritosh K. Malaker; Mostofa A. Reza; Mokhlesur M. Rahman; Rabiul Islam; Apurba K. Chowdhury; Prateek M. Bhattacharya; Ishwar K. Kalappanavar; José Crossa; Arun K. Joshi
Spot blotch (SB) caused by Cochliobolus sativus is a serious biotic stress to wheat in warm and humid areas, particularly South Asia (SA). In order to support South Asian farmers to combat SB, International Maize and Wheat Improvement Center (CIMMYT) established an efficient SB screening system at Agua Fria, Mexico and developed a nursery under the project - Cereal Systems Initiative for South Asia (CSISA). The materials used to form CSISA-SB nursery were selected from advanced breeding lines from different wheat breeding programs at CIMMYT. Seed of CSISA-SB nursery was produced at disease-free plots at El Batan and Mexicali, and distributed to SA after rigorous seed health checks. The 4th CSISA-SB, made available in 2012, comprised 50 entries including two resistant and two susceptible checks. The nursery was evaluated in seven locations in Mexico, India, and Bangladesh in the 2012–13 cropping season. The results indicated that although few lines exhibited stable resistance across locations due to strong G × E interaction, promising lines with SB resistance and good agronomy can still be identified in each location. The two most promising lines showing consistent spot blotch resistance across the regions were CHUKUI#1 (CIMMYT germplasm bank identification number, GID 6178575) and VAYI#1 (GID 6279248). These lines could be promoted as sources of SB resistance or directly released as cultivars in SA. © 2015, Koninklijke Nederlandse Planteziektenkundige Vereniging.
Dissecting Quantitative Trait Loci for Spot Blotch Resistance in South Asia Using Two Wheat Recombinant Inbred Line Populations
(Frontiers Media S.A., 2021) Chandan Roy; Navin C. Gahtyari; Xinyao He; Vinod K. Mishra; Ramesh Chand; Arun K. Joshi; Pawan K. Singh
Spot blotch (SB) disease causes significant yield loss in wheat production in the warm and humid regions of the eastern Gangetic plains (EGP) of South Asia (SA). Most of the cultivated varieties in the eastern part of SA are affected by SB under favorable climatic conditions. To understand the nature of SB resistance and map the underlying resistant loci effective in SA, two bi-parental mapping populations were evaluated for 3 years, i.e., 2013–2015 for the BARTAI × CIANO T79 population (denoted as BC) and 2014–2016 for the CASCABEL × CIANO T79 population (CC), at Varanasi, Uttar Pradesh, India. DArTSeq genotyping-by-sequencing (GBS) platform was used for genotyping of the populations. Distribution of disease reaction of genotypes in both populations was continuous, revealing the quantitative nature of resistance. Significant “genotype,” “year,” and “genotype × year” interactions for SB were observed. Linkage map with the genome coverage of 8,598.3 and 9,024.7 cM in the BC and CC population, respectively, was observed. Two quantitative trait loci (QTLs) were detected on chromosomes 1A and 4D in the BC population with an average contribution of 4.01 and 12.23% of the total phenotypic variation (PV), respectively. Seven stable QTLs were detected on chromosomes 1B, 5A, 5B, 6A, 7A, and 7B in the CC population explaining 2.89–10.32% of PV and collectively 39.91% of the total PV. The QTL detected at the distal end of 5A chromosome contributed 10.32% of the total PV. The QTLs on 6A and 7B in CC could be new, and the one on 5B may represent the Sb2 gene. These QTLs could be used in SB resistance cultivar development for SA. © Copyright © 2021 Roy, Gahtyari, He, Mishra, Chand, Joshi and Singh.
Genomic selection for spot blotch in bread wheat breeding panels, full-sibs and half-sibs and index-based selection for spot blotch, heading and plant height
(Springer Science and Business Media Deutschland GmbH, 2022) Philomin Juliana; Xinyao He; Jesse Poland; Krishna K. Roy; Paritosh K. Malaker; Vinod K. Mishra; Ramesh Chand; Sandesh Shrestha; Uttam Kumar; Chandan Roy; Navin C. Gahtyari; Arun K. Joshi; Ravi P. Singh; Pawan K. Singh
Key message: Genomic selection is a promising tool to select for spot blotch resistance and index-based selection can simultaneously select for spot blotch resistance, heading and plant height. Abstract: A major biotic stress challenging bread wheat production in regions characterized by humid and warm weather is spot blotch caused by the fungus Bipolaris sorokiniana. Since genomic selection (GS) is a promising selection tool, we evaluated its potential for spot blotch in seven breeding panels comprising 6736 advanced lines from the International Maize and Wheat Improvement Center. Our results indicated moderately high mean genomic prediction accuracies of 0.53 and 0.40 within and across breeding panels, respectively which were on average 177.6% and 60.4% higher than the mean accuracies from fixed effects models using selected spot blotch loci. Genomic prediction was also evaluated in full-sibs and half-sibs panels and sibs were predicted with the highest mean accuracy (0.63) from a composite training population with random full-sibs and half-sibs. The mean accuracies when full-sibs were predicted from other full-sibs within families and when full-sibs panels were predicted from other half-sibs panels were 0.47 and 0.44, respectively. Comparison of GS with phenotypic selection (PS) of the top 10% of resistant lines suggested that GS could be an ideal tool to discard susceptible lines, as greater than 90% of the susceptible lines discarded by PS were also discarded by GS. We have also reported the evaluation of selection indices to simultaneously select non-late and non-tall genotypes with low spot blotch phenotypic values and genomic-estimated breeding values. Overall, this study demonstrates the potential of integrating GS and index-based selection for improving spot blotch resistance in bread wheat. © 2022, The Author(s).