A comprehensive iso-conversional analysis of recrystallization in Se78-xTe20Sn2Mx (x = 0, 2; M = In, Ge, Sb, and Pb) alloys

Abstract

The model-fitting non-isothermal methodologies provide valuable insights into the recrystallization, delineating the comprehensive activation energy involved. Investigating the kinetics parameter of recrystallization using their dependence on the conversion reveals meticulous aspects of the recrystallization that cannot be achieved using the non-isothermal model fitting methods. With this perspective in mind, our investigation delves into the iso-conversional analysis of the recrystallization in Se<inf>78-x</inf>Te<inf>20</inf>Sn<inf>2</inf>M<inf>x</inf> (x = 0, 2; M = In, Ge, Sb, and Pb). In the present article, we have examined the dependence of iso-conversional activation energy E<inf>c</inf>, recrystallization rate constant energy K<inf>c</inf>, and order parameter n as a function of the temperature and the degree of conversion αc. Furthermore, we have observed the validity of the Meyer-Neldel compensation rule in the iso-conversional recrystallization. The effect of In, Ge, Sb, and Pb on the iso-conversional kinetic parameters (E<inf>c</inf>, K<inf>c</inf>, and n) has been analyzed by measuring their percentage change before and after the recrystallization. © 2024 Elsevier B.V.