Title:
Icosahedral al6-mg4-cu: Interpretation of x-ray reflections and electron micrographs

dc.contributor.authorV.V. Rao
dc.contributor.authorT.R. Anantharaman
dc.date.accessioned2026-02-09T09:33:18Z
dc.date.issued1989
dc.description.abstractConventional and synchrotron X-ray diffraction patterns from i-Al6Mg4Cu have been indexed on the basis of a tetragonal unit cell. Periodic Moire and lattice fringes observed in TEM support the new structural model. © 1989, Taylor & Francis Group, LLC. All rights reserved.
dc.identifier.doi10.1080/01411598908245735
dc.identifier.issn1411594
dc.identifier.urihttps://doi.org/10.1080/01411598908245735
dc.identifier.urihttps://dl.bhu.ac.in/bhuir/handle/123456789/55462
dc.titleIcosahedral al6-mg4-cu: Interpretation of x-ray reflections and electron micrographs
dc.typePublication
dspace.entity.typeArticle

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