Biplot analysis for spot blotch and yield trait using wami panel of spring wheat

Abstract

Wheat (Triticum aestivum L.) is a staple food worldwide. Spot Blotch (SB) has been a major disease for cultivation of wheat in Eastern Gangatic Plain (EGP). The goal of this study was to evaluate genetically diverse, advanced elite lines of wheat association mapping initiative (WAMI) population to identify useful genetic diversity and other related traits for spot blotch resistance present in WAMI panel for wheat improvement. A panel of 289 elite lines of WAMI population were assessed for spot blotch resistance, days to heading and plot yield for three consecutive years (2012-13, 2013-14 & 2014-15). The significant differences among genotype, year and genotype × year for area under disease progress curve (AUDPC), days to heading and plot yield were exhibited. The negative correlation between days to heading and spot blotch AUDPC was observed whereas, AUDPC and days to heading was significantly and negatively correlated with plot yield. Based on GGE biplot, the first two principal components explained 100%, 100% and 84.5% of the total variation for AUDPC, days to heading and plot yield respectively. Germplasms 9122, 9049 and 9239 were showed most resistant under study. The highest mean value for plot yield was observed for the panel 9061, 9070, 9203, 9216, 9118 and 9227 which were found relatively more stable for grain yield. These genotypes could be used in wheat improvement programmes for developing superior genotypes for yield and spot blotch resistance contributing to food security in south Asia. © 2020, Editorial board of Journal of Experimental Biology and Agricultural Sciences. All rights reserved.